3 December 2025
|
Time (CET) |
Title |
Speaker |
|
10:00 – 10:15 |
Welcome and short introduction of VirtMet |
|
|
10:15 – 11:00 |
Keynote Lecture 1: The use of simulation models in semiconductor optical metrology |
Hugo Cramer, ASML |
|
11:00 – 12:10 |
Session 1 |
|
|
12:10 – 13:30 |
Lunch |
|
|
13:30 – 14:15 |
Keynote Lecture 2: Numerical measurement uncertainty estimation for industrial computed tomography - from basic qualified software for X-ray radiographic simulation tools to numerical measurement uncertainty estimation using a virtual CT system |
Tino Hausotte, FAU Erlangen-Nürnberg |
|
14:15 – 15:25 |
Session 2
|
|
|
15:25 – 15:55 |
Coffee Break |
|
|
15:55 – 17:05 |
Session 3 |
|
4 December 2025
|
Time (CET) |
Title |
Speaker |
|
10:00 – 10:45 |
Keynote Lecture 3: VirtMet in the wild: virtual metrology and virtual testing |
Louise Wright, National Physical Laboratory (NPL) |
|
10:45 – 12:15 |
Session 4 |
|
|
12:15 – 12:30 |
Final Discussion and Goodbye |
|
Download full programme here
